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revisions ltr description date (yr - mo - da) approved a make change to ?v refh to v refl ? limits as specified in 1.3 and add functional test to table i. - ro 01- 06- 05 r. monnin b redraw. update drawing to current requirements. - drw 12- 03- 22 charles f. saffle rev sheet rev sheet rev status rev b b b b b b b b b b b b b b of sheets sheet 1 2 3 4 5 6 7 8 9 10 11 12 13 14 pmic n/a prepared by sandra b. rooney dla land and maritime columbus, ohio 43218 - 3990 http://www.landandmaritime.dla.mil standard microcircuit drawing this drawing is available for use by all departments and agencies of the department of defense checked by charles e. besore approved by michael a. frye microcircuit, digital - linear , 12 - bit, quad, d/a converter, monolithic silicon drawing approval date 93- 05- 20 amsc n/a revision level b size a cage code 67268 5962- 91764 sheet 1 of 14 dscc form 2233 apr 97 5962- e 117- 12
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 2 dscc form 2234 apr 97 1. scope 1.1 scope . this drawing documents two product assurance class levels consisting of high reliability (device classes q and m) and space application (device class v). a choice of case outlines and lead finishes are available and are reflected in th e part or identif ying number (pin). when available, a choice of radiation hardness assurance (rha) levels is reflected in the pin. 1.2 pin . the pin is as shown in the following example: 5962 - 91764 01 m x a federal stock class designator rha designator (see 1.2.1) device type (see 1.2.2) device class designator case outline (see 1.2.4) lead finish (see 1.2.5) \ / (see 1.2.3) \ / drawing number 1.2.1 rha designator . device classes q and v rha marked devices meet the mil - prf - 38535 specified rha levels and are marked with the appropriate rha designator. device class m rha marked devices meet the mil - prf - 38535, appendix a specified rha levels and are marked with the app ropriate rha designator. a dash ( - ) indicates a non- rha device. 1.2.2 device types . the device types identify the circuit function as follows: device type generic number circuit function output registers on reset (see figure 2) 01 dac8412a quad, voltage output, 12 - bit midscale bicmos dac with readback 02 dac8412b quad, voltage output, 12 - bit midscale bicmos dac with readback 03 dac8413a quad, voltage output, 12 - bit zero scale bicmos dac with readback 04 dac8413b quad, voltage output , 12 - bit zero scale bicmos dac with readback 1.2.3 device class designator . the device class designator is a single letter identifying the product assurance level as follows: device class device requirements documentation m vendor self - certification to the requirements for mil- std - 883 compliant, non- jan class level b microcircuits in accordance with mil - prf - 38535, appendix a q or v certification and qualification to mil - prf -38535 1.2.4 case outlines . the case outlines are as de signated in mil - std - 1835 and as follows: outline letter descriptive designator terminals package style x gdip1 - t28 or cdip2- t28 28 dual -in - line 3 cqcc1 - n28 28 square leadless chip carrier 1.2.5 lead finish . the lead finish is as specified in mil - prf - 38535 for device classes q and v or mil- prf - 38535, appendix a for device class m.
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 3 dscc form 2234 apr 97 1.3 absolute maximum ratings . 1 / v ss to v dd ........................................................................................ - 0.3 v dc, +33.0 v dc v ss to v logic ................................................................................... - 0.3 v dc, +23.5 v dc v ss to dgnd ..................................................................................... - 16. 5 v dc v dd to dgnd .................................................................................... +16.5 v dc v logic to dgnd ............................................................................... - 0.3 v dc, +7.0 v dc v ss to v refl ..................................................................................... - 0.3 v dc, v dd ? 2.0 v dc v refh to v dd .................................................................................... +2.0 v dc, +33.0 v dc v refh to v refl ................................................................................ 0 v dc, v dd ? v ss current into any pin ............................................................................ mil - prf -38535 - integrated circuits, manufacturing, general specification for. department of defense standards mil - std -883 - test method standard microcircuits. mil - std -1835 - interface stan dard electronic component case outlines. ________ 1 / stresses above the absolute maximum rating may cause permanent damage to the device. extended operation at the maximum levels may degrade performance and affect reliability. 2 / derate above +80
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 4 dscc form 2234 apr 97 department of defense handbooks mil - hdbk -103 - list of standard microcircuit drawings. mil - hdbk -780 - standard microcircuit drawings. (copies of these documents are availa ble online at https://assist.daps.dla.mil/quicksearch/ or from the standardization document order desk, 700 robbins avenue, building 4d, philadelphia, pa 19111 - 5094.) 2.2 order of precedence . i n the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtain ed. 3. requirements 3.1 item requirements . the individual item requirements for device classes q and v shall be in accordance with mil - prf - 38535 as specified herein, or as modified in the device manufacturer's quality management (qm) plan. the modification in the qm plan shall not affect the form, fit, or function as described herein. the individual item requirement s for device class m shall be in accordance with mi l - prf - 38535, appendix a for non- jan class level b devices and as specified herein. 3.2 design, construction, and physical dimensions . the design, construction, and physical dimensions shall be as specified in mil - prf - 38535 and herein for device classes q and v or mil - prf - 38535, appendix a and herein for device class m. 3.2.1 case outlines . the case outlines shall be in accordanc e with 1.2.4 herein . 3.2.2 terminal connections . the terminal connections shall be as specified on figure 1 . 3.2.3 t ruth table . the truth table shall be as specified on figure 2 . 3.2.4 block diagram . the block diagram s hall be as specified on figure 3 . 3.3 electrical performance characteristics and postirradiation parameter limits . unless otherwise specified he rein, the electrical performance characteristics and postirradiation parameter limits are as specified in table i and shall apply over the full ambient operating temperature range. 3.4 electrical test requirements . the electrical test requirements shal l be the subgroups specified in table ii. the electrical tests for each subgroup are defined in table i. 3.5 marking . the part shall be marked with the pin listed in 1.2 herein. in addition, the manufacturer's pin may also be marked. for packages wh ere marking of the entire smd pin number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962 - " on the device. for rha product using this option, the rha designator shall still be marked. marking for device c lasses q and v shall be in accordance with mil - prf - 38535. marking for device class m shall be in accordance with mil - prf - 38535, appendix a. 3.5.1 certification/compliance mark . the certification mark for device classes q and v shall be a "qml" or "q" as required in mil - prf - 38535. the compliance mark for device class m shall be a "c" as required in mil- prf - 38535, appendix a. 3.6 certificate of compliance . for device classes q and v, a certificate of compliance shall be required from a qml - 38535 lis ted manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). for device class m, a certificat e of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in mil - hdbk - 103 (see 6. 6.2 herein). the certificate of compliance submitted to dla land and maritime - va prior to listing as an approved source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes q and v, the requirements of m il - prf - 38535 and herein or for device class m, the requirements of mil- prf - 38535, appendix a and herein. 3.7 certificate of conformance . a certificate of conformance as required for device classes q and v in mil - prf - 38535 or for device class m in mil - prf -3853 5, appendix a shall be provided with each lot of microcircuits delivered to this drawing.
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 5 dscc form 2234 apr 97 table i. electrical performance characteristics . test symbol conditions 1 / -55 ? ? ?
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 6 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions 1 / -55
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 7 dscc form 2234 apr 97 table i. electrical performance characteristics ? continued. test symbol conditions 1 / -55 ? ?
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 8 dscc form 2234 apr 97 device types 01, 02, 03, 04 case outlines x and 3 terminal number terminal symbol 1 v refh 2 v outb 3 v outa 4 v ss 5 dgnd 6 reset 7 ldac 8 db0 (lsb) 9 db1 10 db2 11 db3 12 db4 13 db5 14 db6 15 db7 16 db8 17 db9 18 db10 19 db11 (msb) 20 r / w 21 a1 22 a0 23 cs 24 v logic 25 v dd 26 v outd 27 v outc 28 v refl figure 1 . terminal connections .
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 9 dscc form 2234 apr 97 a1 a0 r / w cs rs ldac input reg output reg mode dac l l l l h l write write write a l h l l h l write write write b h l l l h l write write write c h h l l h l write write write d l l l l h h write hold write input a l h l l h h write hold write input b h l l l h h write hold write input c h h l l h h write hold write input d l l h l h h read hold read input a l h h l h h read hold read input b h l h l h h read hold read input c h h h l h h read hold read input d x x x h h l hold update all output registers all x x x h h h hold hold hold all x x x x l x * all registers reset to mid/zero scale all x x x h x * all registers latched to mid/zero scale all * device types 01 and 02 reset to midscale, and device types 03 and 04 reset to zero scale. l = low h = high x = don?t care figure 2 . truth table.
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 10 dscc form 2234 apr 97 figure 3 . block diagram .
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 11 dscc form 2234 apr 97 figure 4 . timing waveforms .
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 12 dscc form 2234 apr 97 3.8 notification of change for device class m . for device class m, notification to dla land and maritime - va of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change that affects this drawing. 3.9 verification and review for device class m . for device class m, dla land and maritime, dla land and maritime?s agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. offshore documentation shall be made available onshore at the option of the reviewer. 3.10 microcircuit group assignment for device class m . device class m devices covered by this drawing shall be in microcircuit group number 92 (see mil - prf - 38535, appendix a) 4. verification 4.1 sampling and inspection . for device classes q and v, sampling and inspection procedures shall be in accordance with mil - prf - 38535 or as modified in the devi ce manufacturer's quality management (qm) plan. the modification in the qm plan shall not affect the form, fit, or function as described herein. for device class m, sampling and inspection procedures shal l be in accordance with mil - prf - 38535, appendix a. 4.2 screening . for device classes q and v, screening shall be in accordance with mil - prf - 38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. for device class m, screening shall be in accordance w ith method 5004 of mil - std - 883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 additional criteria for device class m . a. burn - in test, method 1015 of mil- std -883. (1) test condition a, b, c or d . the test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as ap plicable, in accordance with the intent specified in method 1015 of mil - std -883. (2) t a = +125
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 13 dscc form 2234 apr 97 4.4.1 group a inspection . a. tests shall be as specified in table ii herein. b. subgroups 5, 6, and 8 in table i, method 5005 of mil - std - 883 shall be omitted. c . for device class m, subgroups 7 tests shall be sufficient to verify the truth table. for device classes q and v, subgroups 7 shall include verifying the functionality of the device. table ii. electrical test requirements . test requirements subgroups (in accordance with mil - std - 883, method 5005, table i) subgroups (in accordance with mil - prf - 38535, table iii) device class m device class q device class v interim electrical parameters (see 4.2) 1 1 1 final electrical parameters (see 4.2) 1, 2, 3 1 / 1, 2, 3 1 / 1, 2, 3 1 / group a test requirements (see 4.4) 1, 2, 3, 4, 7, 9, 10, 11 2 / 1, 2, 3, 4, 7, 9, 10, 11 2 / 1, 2, 3, 4, 7, 9, 10, 11 2 / group c end - point electrical parameters (see 4.4) 1 1 1 group d end - point electrical parameters (see 4.4) 1 1 1 group e end - point electrical parameters (see 4.4) - - - - - - - - - 1 / pda applies to subgroup 1. 2 / s ubgroups 4, 9, 10, and 11, not tested, but shall be guaranteed to the limits specified in table i herein. 4.4.2 group c inspection . the group c inspection end - point electrical parameters shall be as specified in table ii herein. 4.4.2.1 additional criteria for device class m . steady - state life t est conditions, method 1005 of mil - std -883: a. test condition a, b, c, or d . the test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of mil - std -883. b. t a = +125
standard microcircuit drawing size a 5962- 91764 dla land and maritime columbus, ohio 43218 - 3990 revision level b sheet 14 dscc form 2234 apr 97 4.4.3 group d inspection . the group d inspection end - point electrical parameters shall be as specified in table ii herein. 4.4.4 group e inspection . group e inspection i s required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. end - point electrical parameters shall be as specified in table ii herein. b. for device classes q and v, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in mil - prf - 38535 for the rha level being tested. for device class m, the devices shall be subjected to radiation hardness assured tests as specified in mil - prf - 38535, appendix a for the rha level being tested. all device classes must meet the postirradiation end - point electrical parameter limits as defined in table i at t a = +25 - va and have agreed to this drawing. 6.6.2 approved sources of supply for device class m . approved sources of supply for class m are listed in mil - hdbk - 103. the vendors listed in mil - hdbk - 103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by dla land and mari time -va.
standard microcircuit drawing bulletin date: 12-03-22 approved sources of supply for smd 5962 -91764 are listed below for immediate acquisition information only and shall be added to mil - hdbk - 103 and qml- 38535 during the ne xt revision. mil - hdbk - 103 and qml- 38535 will be revised to include the addition or deletion of sources. the vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by dla land and maritime - va. this information bulletin is superseded by the next dated revision of mil - hdbk - 103 and qml-38535. dla land and maritime maintains an online database of all current sources of supply at htt p://www.landandmaritime.dla.mil/programs/smcr/ . standard microcircuit drawing pin 1 / vendor cage number vendor similar pin 2 / 5962- 9176401mxa 24355 dac8412at/883 5962- 9176402mxa 24355 dac8412bt/883 5962- 9176402m3a 24355 dac8412btc/883 5962- 9176403mxa 24355 dac8413at/883 5962- 9176404mxa 24355 dac8413bt/883 5962- 9176404m3a 24355 dac8413btc/883 1 / the lead finish shown for each pin representing a hermetic package is the most readily available from the manufacturer listed for that part. if the desired lead finish is not listed contact the vendor to determine its availability. 2 / caution . do not use this number for item acquisition. items acquired to this number may not satisfy the performance requirements of this drawing. vendor cage vendor name number and address 24355 analog devices rt 1 industrial park po box 9106 norwood, ma 02062 point of contact: 804 woburn street wilmington, ma 01887 - 3462 the information contained herein is disseminated for convenience only and the government assumes no liability whatsoever for any inaccuracies in the information bulletin.

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